The 13th International Symposium on Measurement Technology and Intelligent Instruments - ISMTII-2017
Xi'an, Shanxi,China
22-25Sept,2017
Call for papers
This symposium will focus on presenting the latest scientific and engineering breakthroughs to develop cutting edge measurement technologies and intelligent instruments. The symposium will also offer precious opportunities for experts of the field together with research students to discuss many state-of-art techniques on the diverse topics of measurement science and technology. During the symposium, exhibition and industrial forum will be organized to show measurement instruments of the latest technologies by many famous manufacturers worldwide.
Symposium Topics (include but not restricted to)
l Micro and Nano Metrology
l In-Process and Online Metrology
l Management of Measurement Processes
l Optical Metrology
l Surface Metrology
l Machine Vision and Image Processing
l Intelligent Instruments for Automation
l Sensors and Actuators
l Calibration and Machine Tool Performance
l Material Characterization
l Education and Training in Metrology
Special Attractions
l Excellent keynote and invited speakers from industry and academia.
l Latest progress in measurement technologies and instruments.
l Visiting Xi'an, the capital of thirteen dynasties in Ancient China, and amazing places, Terracotta Army, Hua Mountain etc.
Click Here to Submit Abstracts
The deadline of Abstracts Submission is 28 February 2017.
l All the accepted papers will be included in the conference proceedings, which will be indexed by Ei Compendex.
l Selected papers will be published on Advanced Manufacturing Technology (AMT), Measurement Science and Technology (MST), Surface Topography: Metrology and Properties, Nanomanufacturing and Nanometrology.
For more information, please check the attachment or visit our website http://www.ismtii2017.com
